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http://dx.doi.org/10.25673/4786
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kalkofen, Bodo | - |
dc.date.accessioned | 2018-09-24T16:18:03Z | - |
dc.date.available | 2018-09-24T16:18:03Z | - |
dc.date.issued | 2007 | - |
dc.identifier.uri | https://opendata.uni-halle.de//handle/1981185920/10828 | - |
dc.identifier.uri | http://dx.doi.org/10.25673/4786 | - |
dc.description.statementofresponsibility | Bodo Kalkofen | - |
dc.format.extent | Online-Ressource (PDF-Datei: 176 S., 3289 KB) | - |
dc.language.iso | ger | - |
dc.publisher | Universitätsbibliothek | - |
dc.publisher | Otto von Guericke University Library, Magdeburg, Germany | - |
dc.subject | Hochschulschrift | - |
dc.subject | Online-Publikation | - |
dc.subject.ddc | 621 | - |
dc.title | Untersuchungen zum Dotieren von Silicium aus einer Oberflächenbelegung mit Phosphor in einem Kurzzeitprozess | - |
dc.title.alternative | Rapid thermal doping of silicon from a phosphorus surface layer | - |
dcterms.type | Hochschulschrift | - |
dc.type | PhDThesis | - |
dc.identifier.urn | urn:nbn:de:101:1-201010181765 | - |
local.publisher.universityOrInstitution | Otto-von-Guericke-Universität Magdeburg | - |
local.subject.keywords | Silicon, shallow junction, rapid thermal doping, vapour phase doping, atomic-layer doping, phosphorus diffusion, phosphine adsorption, sheet resistance, four-point probe, native oxidation | - |
local.openaccess | true | - |
Appears in Collections: | Fakultät für Elektrotechnik und Informationstechnik |
Files in This Item:
File | Description | Size | Format | |
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bodkalkofen.pdf | 3.39 MB | Adobe PDF | View/Open |